Effect of flux creep on current-voltage characteristics of superconducting Y-Ba-Cu-O thin films

Keiji Enpuku, Takanobu Kiss, Ryuichi Sako, Keiji Yoshida, Masakatsu Takeo, Kaoru Yamafuji

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

Temperature dependence of current-voltage characteristics of Y-Ba-Cu-O thin films is studied experimentally. The observed results are analyzed with the flux creep model, and good agreement is obtained between the theory and the experiment. Using the flux creep model, the pinning potential, U, is obtained as U(T=0)≳77 meV for thin films with jc(T=0)≳2·107A/cm2. The temperature dependence of U is also obtained, and the result is discussed based on the pinning theory.

Original languageEnglish
Pages (from-to)L991-L993
JournalJapanese Journal of Applied Physics
Volume28
Issue number6A
DOIs
Publication statusPublished - Jan 1 1989

Fingerprint

Current voltage characteristics
Creep
Fluxes
Thin films
temperature dependence
electric potential
thin films
Temperature
Experiments

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Effect of flux creep on current-voltage characteristics of superconducting Y-Ba-Cu-O thin films. / Enpuku, Keiji; Kiss, Takanobu; Sako, Ryuichi; Yoshida, Keiji; Takeo, Masakatsu; Yamafuji, Kaoru.

In: Japanese Journal of Applied Physics, Vol. 28, No. 6A, 01.01.1989, p. L991-L993.

Research output: Contribution to journalArticle

Enpuku, Keiji ; Kiss, Takanobu ; Sako, Ryuichi ; Yoshida, Keiji ; Takeo, Masakatsu ; Yamafuji, Kaoru. / Effect of flux creep on current-voltage characteristics of superconducting Y-Ba-Cu-O thin films. In: Japanese Journal of Applied Physics. 1989 ; Vol. 28, No. 6A. pp. L991-L993.
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