Effect of flux creep on current-voltage characteristics of superconducting Y-Ba-Cu-O thin films

Keiji Enpuku, Takanobu Kisu, Ryuichi Sako, Keiji Yoshida, Masakatsu Takeo, Kaoru Yamafuji

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Abstract

Temperature dependence of current-voltage characteristics of Y-Ba-Cu-O thin films is studied experimentally. The observed results are analyzed with the flux creep model, and good agreement is obtained between the theory and the experiment. Using the flux creep model, the pinning potential, U, is obtained as U(T=0)≳77 meV for thin films with jc(T=0)≳2·107A/cm2. The temperature dependence of U is also obtained, and the result is discussed based on the pinning theory.

Original languageEnglish
Pages (from-to)L991-L993
JournalJapanese Journal of Applied Physics
Volume28
Issue number6A
DOIs
Publication statusPublished - Jun 1989

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All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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