Effect of stray field induced by cross shape in a 200-nm-wide Co wire

Takashi Kimura, Fujio Wakaya, Kenji Gamo

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

200-nm-wide Co wires connected to two 1-μm-width crossing probes, which play domain-wall-trap sites with a variable interval between the two probes in the range from 2 to 10μm, were fabricated by using electron-beam lithography. The relation between the magnetization switch of the wire and the probe interval was studied by measuring the longitudinal magnetoresistance. The switching field enlarged with increasing the probe interval at the shorter length (<6μm), and seemed to saturate at longer length (>6μm). The resistance changes during the magnetization reversal reduced with increasing the probe interval. These behaviors were explained by considering the stray field caused by the magnetic charge generated at the boundary between the crossing and the wire regions.

Original languageEnglish
Pages (from-to)262-266
Number of pages5
JournalJournal of Magnetism and Magnetic Materials
Volume236
Issue number3
DOIs
Publication statusPublished - Nov 1 2001
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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