Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method

Momoji Kubo, Kazumi Serizawa, Hiromi Kikuchi, Riadh Sahnoun, Michihisa Koyama, Hideyuki Tsuboi, Nozomu Hatakeyama, Akira Endou, Hiromitsu Takaba, Carlos A. Del Carpio, Hiroshi Kajiyama, Tsutae Shinoda, Akira Miyamoto

    Research output: Contribution to conferencePaperpeer-review

    1 Citation (Scopus)

    Abstract

    Our original molecular dynamics code was applied to the destruction dynamics of MgO protecting layer in the plasma display panel by Xe sputtering. The effect of surface contamination on the destruction and recrystallization dynamics of the MgO protecting layer was clarified. Especially, we elucidated that adsorbed water molecules are dissociated and hydrogen atoms are intruded into the MgO surface by Xe sputtering. These phenomena were suggested to degrade significantly the second electron emission ability of the MgO protecting layer.

    Original languageEnglish
    Pages787-790
    Number of pages4
    Publication statusPublished - Dec 1 2007
    Event14th International Display Workshops, IDW '07 - Sapporo, Japan
    Duration: Dec 5 2007Dec 5 2007

    Other

    Other14th International Display Workshops, IDW '07
    CountryJapan
    CitySapporo
    Period12/5/0712/5/07

    All Science Journal Classification (ASJC) codes

    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials
    • Radiology Nuclear Medicine and imaging
    • Atomic and Molecular Physics, and Optics

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