Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method

Momoji Kubo, Kazumi Serizawa, Hiromi Kikuchi, Riadh Sahnoun, Michihisa Koyama, Hideyuki Tsuboi, Nozomu Hatakeyama, Akira Endou, Hiromitsu Takaba, Carlos A. Del Carpio, Hiroshi Kajiyama, Tsutae Shinoda, Akira Miyamoto

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

Our original molecular dynamics code was applied to the destruction dynamics of MgO protecting layer in the plasma display panel by Xe sputtering. The effect of surface contamination on the destruction and recrystallization dynamics of the MgO protecting layer was clarified. Especially, we elucidated that adsorbed water molecules are dissociated and hydrogen atoms are intruded into the MgO surface by Xe sputtering. These phenomena were suggested to degrade significantly the second electron emission ability of the MgO protecting layer.

Original languageEnglish
Pages787-790
Number of pages4
Publication statusPublished - Dec 1 2007
Event14th International Display Workshops, IDW '07 - Sapporo, Japan
Duration: Dec 5 2007Dec 5 2007

Other

Other14th International Display Workshops, IDW '07
CountryJapan
CitySapporo
Period12/5/0712/5/07

Fingerprint

Dynamic recrystallization
Molecular Dynamics Simulation
destruction
Sputtering
Molecular dynamics
Hydrogen
contamination
Contamination
Display devices
Electrons
molecular dynamics
Plasmas
Water
Electron emission
Computer simulation
sputtering
simulation
Atoms
electron emission
Molecules

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging
  • Atomic and Molecular Physics, and Optics

Cite this

Kubo, M., Serizawa, K., Kikuchi, H., Sahnoun, R., Koyama, M., Tsuboi, H., ... Miyamoto, A. (2007). Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method. 787-790. Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan.

Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method. / Kubo, Momoji; Serizawa, Kazumi; Kikuchi, Hiromi; Sahnoun, Riadh; Koyama, Michihisa; Tsuboi, Hideyuki; Hatakeyama, Nozomu; Endou, Akira; Takaba, Hiromitsu; Del Carpio, Carlos A.; Kajiyama, Hiroshi; Shinoda, Tsutae; Miyamoto, Akira.

2007. 787-790 Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan.

Research output: Contribution to conferencePaper

Kubo, M, Serizawa, K, Kikuchi, H, Sahnoun, R, Koyama, M, Tsuboi, H, Hatakeyama, N, Endou, A, Takaba, H, Del Carpio, CA, Kajiyama, H, Shinoda, T & Miyamoto, A 2007, 'Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method', Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan, 12/5/07 - 12/5/07 pp. 787-790.
Kubo M, Serizawa K, Kikuchi H, Sahnoun R, Koyama M, Tsuboi H et al. Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method. 2007. Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan.
Kubo, Momoji ; Serizawa, Kazumi ; Kikuchi, Hiromi ; Sahnoun, Riadh ; Koyama, Michihisa ; Tsuboi, Hideyuki ; Hatakeyama, Nozomu ; Endou, Akira ; Takaba, Hiromitsu ; Del Carpio, Carlos A. ; Kajiyama, Hiroshi ; Shinoda, Tsutae ; Miyamoto, Akira. / Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method. Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan.4 p.
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AU - Koyama, Michihisa

AU - Tsuboi, Hideyuki

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AU - Shinoda, Tsutae

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