Effect of test patterns on measurement of the luminance of LCD devices by use of a telescopic-type luminance meter.

Junji Morishita, Kiyoshi Dogomori, Shiro Hatanaka, Takeshi Hiwasa, Yasuhiko Nakamura, Noriyuki Hashimoto, Yoshiharu Higashida, Fukai Toyofuku, Masafumi Ohki

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