Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection

Koen Joosse, Hiroshi Nakagawa, Hiroshi Akoh, Susumu Takada, Keisuke Maehata, Kenji Ishibashi

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Nb/Al-AlOx/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.

Original languageEnglish
Pages (from-to)2633-2637
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume35
Issue number5 SUPPL. A
Publication statusPublished - May 1 1996

Fingerprint

Tunnel junctions
tunnel junctions
Leakage currents
critical current
leakage
current density
Radiation
radiation
Current voltage characteristics
Surface morphology
suggestion
X rays
Temperature
Defects
Electrodes
Processing
trends
optimization
electrodes
causes

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection. / Joosse, Koen; Nakagawa, Hiroshi; Akoh, Hiroshi; Takada, Susumu; Maehata, Keisuke; Ishibashi, Kenji.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 35, No. 5 SUPPL. A, 01.05.1996, p. 2633-2637.

Research output: Contribution to journalArticle

@article{3fe2f5de7f164838a93ec8a65ae9ed8b,
title = "Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection",
abstract = "Nb/Al-AlOx/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.",
author = "Koen Joosse and Hiroshi Nakagawa and Hiroshi Akoh and Susumu Takada and Keisuke Maehata and Kenji Ishibashi",
year = "1996",
month = "5",
day = "1",
language = "English",
volume = "35",
pages = "2633--2637",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Institute of Physics",
number = "5 SUPPL. A",

}

TY - JOUR

T1 - Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection

AU - Joosse, Koen

AU - Nakagawa, Hiroshi

AU - Akoh, Hiroshi

AU - Takada, Susumu

AU - Maehata, Keisuke

AU - Ishibashi, Kenji

PY - 1996/5/1

Y1 - 1996/5/1

N2 - Nb/Al-AlOx/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.

AB - Nb/Al-AlOx/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.

UR - http://www.scopus.com/inward/record.url?scp=0030142120&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030142120&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0030142120

VL - 35

SP - 2633

EP - 2637

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 5 SUPPL. A

ER -