Effect of thermal strain on domain fraction in a-/b-axis-oriented epitaxial Bi4Ti3O12 films

Takayuki Watanabe, Hitoshi Morioka, Shoji Okamoto, Masatake Takahashi, Yuji Noguchi, Masaru Miyayama, Hiroshi Funakubo

Research output: Contribution to journalConference article

Abstract

a-/b-axis-oriented epitaxial Bi4Ti3O12 and neodymiura-substituted Bi4Ti3O12 films with a different a-domain fraction, V(100)/[V(100)+V( 010)], were grown by metalorganic chemical vapor deposition above the phase transition temperature. It was demonstrated that the saturation polarization observed for the a-/b-axis-oriented film is proportional to the a-domain fraction estimated by x-ray diffraction. The liner relationship passing through the origin revealed that the 90° domain switching by an external electric field hardly occurred. The extrapolation gave spontaneous polarization of 58 μC/cm for a pure a-axis-oriented (Bi3.5Nd 0.5)Ti3O12 film. The domain fraction was investigated as a function of thermal strain originated from a difference in thermal expansion coefficient between the film and substrates. The domain fraction of the films changed with the thermal strain along the in-plane [010] in tetragonal a-axis-oriented films as well as epitaxially grown tetragonal Pb(Zr,Ti)O3 films.

Original languageEnglish
Pages (from-to)109-114
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume784
Publication statusPublished - Dec 1 2003
Externally publishedYes
EventFerroelectric Thin Films XII - Boston, MA, United States
Duration: Dec 1 2003Dec 4 2003

Fingerprint

Epitaxial films
polarization
Polarization
thermal expansion
Metallorganic chemical vapor deposition
Hot Temperature
effect
liner
phase transition
Extrapolation
diffraction
Superconducting transition temperature
Thermal expansion
electric field
Diffraction
Phase transitions
Electric fields
saturation
substrate
X rays

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Watanabe, T., Morioka, H., Okamoto, S., Takahashi, M., Noguchi, Y., Miyayama, M., & Funakubo, H. (2003). Effect of thermal strain on domain fraction in a-/b-axis-oriented epitaxial Bi4Ti3O12 films. Materials Research Society Symposium - Proceedings, 784, 109-114.

Effect of thermal strain on domain fraction in a-/b-axis-oriented epitaxial Bi4Ti3O12 films. / Watanabe, Takayuki; Morioka, Hitoshi; Okamoto, Shoji; Takahashi, Masatake; Noguchi, Yuji; Miyayama, Masaru; Funakubo, Hiroshi.

In: Materials Research Society Symposium - Proceedings, Vol. 784, 01.12.2003, p. 109-114.

Research output: Contribution to journalConference article

Watanabe, T, Morioka, H, Okamoto, S, Takahashi, M, Noguchi, Y, Miyayama, M & Funakubo, H 2003, 'Effect of thermal strain on domain fraction in a-/b-axis-oriented epitaxial Bi4Ti3O12 films', Materials Research Society Symposium - Proceedings, vol. 784, pp. 109-114.
Watanabe, Takayuki ; Morioka, Hitoshi ; Okamoto, Shoji ; Takahashi, Masatake ; Noguchi, Yuji ; Miyayama, Masaru ; Funakubo, Hiroshi. / Effect of thermal strain on domain fraction in a-/b-axis-oriented epitaxial Bi4Ti3O12 films. In: Materials Research Society Symposium - Proceedings. 2003 ; Vol. 784. pp. 109-114.
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AU - Takahashi, Masatake

AU - Noguchi, Yuji

AU - Miyayama, Masaru

AU - Funakubo, Hiroshi

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