Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification

Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

26 Citations (Scopus)

Abstract

Test data modification based on test relaxation and X-filling is the preferable approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlling X-Identification (DC-XID), which controls the distribution of X-bits identified from a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experimental results on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without any impact on fault coverage, test data volume, or test circuit size.

Original languageEnglish
Title of host publication2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008
Pages52-58
Number of pages7
DOIs
Publication statusPublished - Dec 26 2008
Event2008 International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States
Duration: Nov 10 2008Nov 13 2008

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Other

Other2008 International Conference on Computer-Aided Design, ICCAD
CountryUnited States
CitySan Jose, CA
Period11/10/0811/13/08

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All Science Journal Classification (ASJC) codes

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

Cite this

Miyase, K., Noda, K., Ito, H., Hatayama, K., Aikyo, T., Yamato, Y., ... Kajihara, S. (2008). Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification. In 2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008 (pp. 52-58). [4681551] (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). https://doi.org/10.1109/ICCAD.2008.4681551