Effects of electroless Ni/Sn bump formation using hydrogen-plasma reflow on the electrical characteristics of MOSFETs

Akihiro Ikeda, Yashuhiro Kimiya, Yoshiaki Fukunaga, Hiroshi Ogi, Reiji Hattori, Hisao Kuriyaki, Yashuhide Ohno, Yukinori Kuroki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering & Materials Science