Effects of stray fields in flat-end and pointed-end NiFe/Cu/NiFe/NiO wires

Takashi Kimura, Fujio Wakaya, Kenji Gamo

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


The effects of the stray fields induced by pinned layers in two-types of 1-μm-wide NiFe/Cu/NiFe/NiO wires were investigated using the giant magnetoresistance effect and exchange anisotropy. One wire had flat ends and the other had pointed ends. It was found that the switching field of the free layer in the flat-end wire was smaller than that in the pointed-end wire because of the larger demagnetizing and stray fields and that the stray field in the pointed-end wire can be negligible. The stray field estimated from the experimental result in the flat-end wire was consistently explained by the magnetic charges at the wire end in the pinned layer.

Original languageEnglish
Pages (from-to)6357-6359
Number of pages3
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Issue number11
Publication statusPublished - Nov 2001
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)


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