Effects of transcranial magnetic stimulation on EEG activities

Keiji Iramina, Yasuyuki Kowatari, Shoogo Ueno

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Transcranial magnetic stimulation (TMS) with EEG measurement has been used to eliminate cortical reactivity and connectivity. We developed an electroencephalogram (EEG) with TMS measurement system. In our system, it is possible to measure EEG after TMS without the artifacts of the magnetic stimulation on EEG. In this study, we stimulated the right motor area and occipital area using a figure-eight coil and measured the effect on the alpha wave to investigate area-to-area neuronal connections.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
Publication statusPublished - Jan 1 2002
Externally publishedYes
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
CountryNetherlands
CityAmsterdam
Period4/28/025/2/02

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

Cite this

Iramina, K., Kowatari, Y., & Ueno, S. (2002). Effects of transcranial magnetic stimulation on EEG activities. In J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, J. De Boeck, ... R. Wood (Eds.), INTERMAG Europe 2002 - IEEE International Magnetics Conference [1001373] (INTERMAG Europe 2002 - IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1001373