Electric field induced structural change for poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films studied by scanning Maxwell stress microscope

Tisato Kajiyama, Noppadol Khuwattanasil, Atsushi Takahara

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

Poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF/TrFE), VDF 75 mol %] ultrathin films of 10 nm thickness were prepared on gold coated silicon wafer substrates by a spin-coating method and their aggregation states were investigated by Fourier transform infrared reflection absorption spectroscopic measurement. It was found that P(VDF/TrFE) formed a ferroelectric phase even in a confined state such as an ultrathin film. The electric field was locally imposed on the ultrathin film through a gold coated cantilever tip. The change of dipole moment orientation of P(VDF/TrFE) was evaluated by measuring surface potential change, performed by scanning Maxwell stress microscopy (SMM). The SMM images revealed that the local dipole moment orientation of P(VDF/ TrFE) in ultrathin films could be changed by an application of electric field through an atomic force microscope tip.

Original languageEnglish
Pages (from-to)121-124
Number of pages4
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume16
Issue number1
Publication statusPublished - Jan 1 1998

Fingerprint

Ultrathin films
vinylidene
fluorides
Microscopes
microscopes
Electric fields
Scanning
scanning
electric fields
Dipole moment
Microscopic examination
dipole moments
Gold
gold
microscopy
infrared reflection
Spin coating
Surface potential
Silicon wafers
Ferroelectric materials

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

@article{39c6a3a5a1dc4e7ea6860cf9cd418a76,
title = "Electric field induced structural change for poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films studied by scanning Maxwell stress microscope",
abstract = "Poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF/TrFE), VDF 75 mol {\%}] ultrathin films of 10 nm thickness were prepared on gold coated silicon wafer substrates by a spin-coating method and their aggregation states were investigated by Fourier transform infrared reflection absorption spectroscopic measurement. It was found that P(VDF/TrFE) formed a ferroelectric phase even in a confined state such as an ultrathin film. The electric field was locally imposed on the ultrathin film through a gold coated cantilever tip. The change of dipole moment orientation of P(VDF/TrFE) was evaluated by measuring surface potential change, performed by scanning Maxwell stress microscopy (SMM). The SMM images revealed that the local dipole moment orientation of P(VDF/ TrFE) in ultrathin films could be changed by an application of electric field through an atomic force microscope tip.",
author = "Tisato Kajiyama and Noppadol Khuwattanasil and Atsushi Takahara",
year = "1998",
month = "1",
day = "1",
language = "English",
volume = "16",
pages = "121--124",
journal = "Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena",
issn = "0734-211X",
publisher = "AVS Science and Technology Society",
number = "1",

}

TY - JOUR

T1 - Electric field induced structural change for poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films studied by scanning Maxwell stress microscope

AU - Kajiyama, Tisato

AU - Khuwattanasil, Noppadol

AU - Takahara, Atsushi

PY - 1998/1/1

Y1 - 1998/1/1

N2 - Poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF/TrFE), VDF 75 mol %] ultrathin films of 10 nm thickness were prepared on gold coated silicon wafer substrates by a spin-coating method and their aggregation states were investigated by Fourier transform infrared reflection absorption spectroscopic measurement. It was found that P(VDF/TrFE) formed a ferroelectric phase even in a confined state such as an ultrathin film. The electric field was locally imposed on the ultrathin film through a gold coated cantilever tip. The change of dipole moment orientation of P(VDF/TrFE) was evaluated by measuring surface potential change, performed by scanning Maxwell stress microscopy (SMM). The SMM images revealed that the local dipole moment orientation of P(VDF/ TrFE) in ultrathin films could be changed by an application of electric field through an atomic force microscope tip.

AB - Poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF/TrFE), VDF 75 mol %] ultrathin films of 10 nm thickness were prepared on gold coated silicon wafer substrates by a spin-coating method and their aggregation states were investigated by Fourier transform infrared reflection absorption spectroscopic measurement. It was found that P(VDF/TrFE) formed a ferroelectric phase even in a confined state such as an ultrathin film. The electric field was locally imposed on the ultrathin film through a gold coated cantilever tip. The change of dipole moment orientation of P(VDF/TrFE) was evaluated by measuring surface potential change, performed by scanning Maxwell stress microscopy (SMM). The SMM images revealed that the local dipole moment orientation of P(VDF/ TrFE) in ultrathin films could be changed by an application of electric field through an atomic force microscope tip.

UR - http://www.scopus.com/inward/record.url?scp=0031682025&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031682025&partnerID=8YFLogxK

M3 - Article

VL - 16

SP - 121

EP - 124

JO - Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena

JF - Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena

SN - 0734-211X

IS - 1

ER -