Fingerprint Dive into the research topics of 'Electrical characterization of strained Si/SiGe wafers using transient capacitance measurements'. Together they form a unique fingerprint.
- Sort by
- Weight
- Alphabetically
Electrical characterization of strained Si/SiGe wafers using transient capacitance measurements
Dong Wang, Masaharu Ninomiya, Masahiko Nakamae, Hiroshi Nakashima
Research output: Contribution to journal › Article › peer-review
13
Citations
(Scopus)