Electrical properties of (Ca,Sr)Bi4Ti4O15 thin films fabricated using a chemical solution deposition method

Hiroshi Uchida, Keiko Sakurai, Isao Okada, Hirofumi Matsuda, Takashi Iijima, Takashi Kojima, Takayuki Watanabe, Hiroshi Funakubo

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13 Citations (Scopus)

Abstract

Thin films of calcium-strontium bismuth titanate (Ca1-xSrx)Bi4Ti4O15 solid solution were fabricated on (111)Pt/Ti/SiO2/(100)Si substrates by a chemical-solution deposition (CSD) technique. These films had x = 0-1.00 and consisted of a polycrystalline structure with random orientation of the bismuth layer-structured ferroelectric (BLSF) crystal (m = 4). The relative dielectric constants of (Ca1-xSrx)Bi4Ti4O15 films were enhanced from 40 to 220 with increasing x; these values did not vary significantly with changes in the measuring frequency and the bias field. The temperature coefficient of the relative dielectric constant at around room temperature became larger with increasing x from 0 to 1.00; the change in the dielectric constant of these films between 30-100°C increased from 2% to 15%.

Original languageEnglish
Pages (from-to)5990-5993
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume42
Issue number9 B
DOIs
Publication statusPublished - Sep 2003
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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