Abstract
Thin films of calcium-strontium bismuth titanate (Ca1-xSrx)Bi4Ti4O15 solid solution were fabricated on (111)Pt/Ti/SiO2/(100)Si substrates by a chemical-solution deposition (CSD) technique. These films had x = 0-1.00 and consisted of a polycrystalline structure with random orientation of the bismuth layer-structured ferroelectric (BLSF) crystal (m = 4). The relative dielectric constants of (Ca1-xSrx)Bi4Ti4O15 films were enhanced from 40 to 220 with increasing x; these values did not vary significantly with changes in the measuring frequency and the bias field. The temperature coefficient of the relative dielectric constant at around room temperature became larger with increasing x from 0 to 1.00; the change in the dielectric constant of these films between 30-100°C increased from 2% to 15%.
| Original language | English |
|---|---|
| Pages (from-to) | 5990-5993 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 42 |
| Issue number | 9 B |
| Publication status | Published - Sep 1 2003 |
| Externally published | Yes |
Fingerprint
All Science Journal Classification (ASJC) codes
- Engineering(all)
- Physics and Astronomy(all)
Cite this
Electrical properties of (Ca,Sr)Bi4Ti4O15 thin films fabricated using a chemical solution deposition method. / Uchida, Hiroshi; Sakurai, Keiko; Okada, Isao; Matsuda, Hirofumi; Iijima, Takashi; Kojima, Takashi; Watanabe, Takayuki; Funakubo, Hiroshi.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 42, No. 9 B, 01.09.2003, p. 5990-5993.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Electrical properties of (Ca,Sr)Bi4Ti4O15 thin films fabricated using a chemical solution deposition method
AU - Uchida, Hiroshi
AU - Sakurai, Keiko
AU - Okada, Isao
AU - Matsuda, Hirofumi
AU - Iijima, Takashi
AU - Kojima, Takashi
AU - Watanabe, Takayuki
AU - Funakubo, Hiroshi
PY - 2003/9/1
Y1 - 2003/9/1
N2 - Thin films of calcium-strontium bismuth titanate (Ca1-xSrx)Bi4Ti4O15 solid solution were fabricated on (111)Pt/Ti/SiO2/(100)Si substrates by a chemical-solution deposition (CSD) technique. These films had x = 0-1.00 and consisted of a polycrystalline structure with random orientation of the bismuth layer-structured ferroelectric (BLSF) crystal (m = 4). The relative dielectric constants of (Ca1-xSrx)Bi4Ti4O15 films were enhanced from 40 to 220 with increasing x; these values did not vary significantly with changes in the measuring frequency and the bias field. The temperature coefficient of the relative dielectric constant at around room temperature became larger with increasing x from 0 to 1.00; the change in the dielectric constant of these films between 30-100°C increased from 2% to 15%.
AB - Thin films of calcium-strontium bismuth titanate (Ca1-xSrx)Bi4Ti4O15 solid solution were fabricated on (111)Pt/Ti/SiO2/(100)Si substrates by a chemical-solution deposition (CSD) technique. These films had x = 0-1.00 and consisted of a polycrystalline structure with random orientation of the bismuth layer-structured ferroelectric (BLSF) crystal (m = 4). The relative dielectric constants of (Ca1-xSrx)Bi4Ti4O15 films were enhanced from 40 to 220 with increasing x; these values did not vary significantly with changes in the measuring frequency and the bias field. The temperature coefficient of the relative dielectric constant at around room temperature became larger with increasing x from 0 to 1.00; the change in the dielectric constant of these films between 30-100°C increased from 2% to 15%.
UR - http://www.scopus.com/inward/record.url?scp=0345603681&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0345603681&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0345603681
VL - 42
SP - 5990
EP - 5993
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 9 B
ER -