Electrodeposited metallic nanowires as a scanning probe tip

Munekazu Motoyama; Friedrich B. Prinz

Electrodeposited metallic nanowires as a scanning probe tip

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.

Original language	English
Title of host publication	Multifunction at the Nanoscale through Nanowires
Pages	34-39
Number of pages	6
Publication status	Published - 2010
Externally published	Yes
Event	2009 MRS Fall Meeting - Boston, MA, United States Duration: Nov 30 2009 → Dec 4 2009

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	1206
ISSN (Print)	0272-9172

Other

Other	2009 MRS Fall Meeting
Country/Territory	United States
City	Boston, MA
Period	11/30/09 → 12/4/09

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Cite this

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title = "Electrodeposited metallic nanowires as a scanning probe tip",

abstract = "This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.",

author = "Munekazu Motoyama and Prinz, {Friedrich B.}",

year = "2010",

language = "English",

isbn = "9781617387609",

series = "Materials Research Society Symposium Proceedings",

pages = "34--39",

booktitle = "Multifunction at the Nanoscale through Nanowires",

note = "2009 MRS Fall Meeting ; Conference date: 30-11-2009 Through 04-12-2009",

}

TY - GEN

T1 - Electrodeposited metallic nanowires as a scanning probe tip

AU - Motoyama, Munekazu

AU - Prinz, Friedrich B.

PY - 2010

Y1 - 2010

N2 - This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.

AB - This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.

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UR - http://www.scopus.com/inward/citedby.url?scp=77957765659&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:77957765659

SN - 9781617387609

T3 - Materials Research Society Symposium Proceedings

SP - 34

EP - 39

BT - Multifunction at the Nanoscale through Nanowires

T2 - 2009 MRS Fall Meeting

Y2 - 30 November 2009 through 4 December 2009

ER -

Electrodeposited metallic nanowires as a scanning probe tip

Abstract

Publication series

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All Science Journal Classification (ASJC) codes

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