Electrodeposited metallic nanowires as a scanning probe tip

Munekazu Motoyama, Friedrich B. Prinz

Research output: Chapter in Book/Report/Conference proceedingConference contribution


This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.

Original languageEnglish
Title of host publicationMultifunction at the Nanoscale through Nanowires
Number of pages6
Publication statusPublished - 2010
Externally publishedYes
Event2009 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 30 2009Dec 4 2009

Publication series

NameMaterials Research Society Symposium Proceedings
ISSN (Print)0272-9172


Other2009 MRS Fall Meeting
Country/TerritoryUnited States
CityBoston, MA

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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