Electrodynamic c-axis properties of YBa2Cu3O7-δ thin films in the THz frequency regime

Ch Ludwig, T. Sekinger, J. Kühl, H. U. Habermeier, M. Tani, K. Sakai, M. Hangyo, S. Miyazawa, Masashi Mukaida

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Using coherent THz pulse spectroscopy, we have analyzed the electrodynamic properties of thin YBa2Cu3O7-δ films in the temperature range between 10 and 300 K. The temperature dependence of the London penetration depth in c-axis direction determined from the complex conductivity yields clear evidence for d-wave symmetry of the order parameter.

Original languageEnglish
Pages (from-to)405-413
Number of pages9
JournalPhysica Status Solidi (B) Basic Research
Volume213
Issue number2
DOIs
Publication statusPublished - Jan 1 1999
Externally publishedYes

Fingerprint

Electrodynamics
electrodynamics
penetration
Thin films
conductivity
temperature dependence
symmetry
thin films
pulses
spectroscopy
Spectroscopy
Temperature
temperature
barium copper yttrium oxide
Direction compound

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Electrodynamic c-axis properties of YBa2Cu3O7-δ thin films in the THz frequency regime. / Ludwig, Ch; Sekinger, T.; Kühl, J.; Habermeier, H. U.; Tani, M.; Sakai, K.; Hangyo, M.; Miyazawa, S.; Mukaida, Masashi.

In: Physica Status Solidi (B) Basic Research, Vol. 213, No. 2, 01.01.1999, p. 405-413.

Research output: Contribution to journalArticle

Ludwig, Ch ; Sekinger, T. ; Kühl, J. ; Habermeier, H. U. ; Tani, M. ; Sakai, K. ; Hangyo, M. ; Miyazawa, S. ; Mukaida, Masashi. / Electrodynamic c-axis properties of YBa2Cu3O7-δ thin films in the THz frequency regime. In: Physica Status Solidi (B) Basic Research. 1999 ; Vol. 213, No. 2. pp. 405-413.
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AU - Tani, M.

AU - Sakai, K.

AU - Hangyo, M.

AU - Miyazawa, S.

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