Electron beam and laser testing on the novel stripixel detectors

Z. Li, H. En'Yo, V. Eremin, Y. Goto, C. J. Li, A. Taketani, J. Tojo

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)

Abstract

The novel Si stripixel detector, developed at BNL (Brookhaven National Laboratory), has been applied in the development of a prototype Si strip detector system for the PHENIX Upgrade at RHIC. The Si stripixel detector can generate X-Y two-dimensional (2D) position sensitivity with single-sided processing and readout. Test stripixel detectors with pitches of 85 and 560 μm have been subjected to the electron beam test in a SEM set-up, and to the laser beam test in a lab test fixture with an X-Y-Z table for laser scanning. Test results have shown that the X and Y strips are well isolated from each other, and 2D position sensitivity has been well demonstrated in the novel stripixel detectors.

Original languageEnglish
Pages (from-to)21-28
Number of pages8
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume541
Issue number1-2
DOIs
Publication statusPublished - Apr 1 2005
Externally publishedYes
EventDevelopment and Application of semiconductor Tracking Detectors -
Duration: Jun 14 2004Jun 17 2004

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Fingerprint Dive into the research topics of 'Electron beam and laser testing on the novel stripixel detectors'. Together they form a unique fingerprint.

Cite this