Electron detachment spectroscopic study on carbon and silicon cluster anions

Y. Achiba, M. Kohno, M. Ohara, S. Suzuki, H. Shiromaru

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The electron detachment of mass-selected carbon and silicon cluster anions was studied using different ion-source conditions. Ultraviolet photoelectron spectra of medium-sized carbon cluster anions were measured using a laser vaporization source with different fluences. On systematic inspection, the series of spectra showed 4n-periodicity in their electron affinity, which is consistent with the predicted ring-form structure. For silicon cluster anions, resonance-enhanced multiphoton electron detachment spectra were measured. The role of the carrier gases He, N2 and CO2 is discussed.

Original languageEnglish
Pages (from-to)231-240
Number of pages10
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume142
Issue number3 SPEC. ISS.
DOIs
Publication statusPublished - Mar 2005

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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