Electron microscopic analysis of surface damaged layer in Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystal

Yusuke Kasuya; Yukio Sato; Ryosuke Urakami; Kazuhiro Yamada; Ryo Teranishi; Kenji Kaneko

doi:10.7567/JJAP.56.010312

Electron microscopic analysis of surface damaged layer in Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃ single crystal

Yusuke Kasuya, Yukio Sato, Ryosuke Urakami, Kazuhiro Yamada, Ryo Teranishi, Kenji Kaneko

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Single crystals of lead magnesium niobate-lead titanate, Pb (Mg_1/3Nb_2/3)O₃-PbTiO₃ (PMN-PT), have superior dielectric and piezoelectric properties suitable for medical ultrasound imaging. Imaging devices with superior performance can be manufactured from thinner PMN-PT single crystals by mechanical dicing and/or polishing. Although it is often a concern that a damaged layer may form during the mechanical dicing and/or thinning process, the microscopic characteristics of the damaged layer have not yet been investigated in detail. In this study, the microstructural characterization of a damaged layer was investigated by transmission electron microscopy. It was found that mechanical polishing introduced dislocation near the surface of the crystal. It was also found that the domain structure was affected by the introduction of dislocation.

Original language	English
Article number	010312
Journal	Japanese Journal of Applied Physics
Volume	56
Issue number	1
DOIs	https://doi.org/10.7567/JJAP.56.010312
Publication status	Published - Jan 2017

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy(all)

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title = "Electron microscopic analysis of surface damaged layer in Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystal",

abstract = "Single crystals of lead magnesium niobate-lead titanate, Pb (Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT), have superior dielectric and piezoelectric properties suitable for medical ultrasound imaging. Imaging devices with superior performance can be manufactured from thinner PMN-PT single crystals by mechanical dicing and/or polishing. Although it is often a concern that a damaged layer may form during the mechanical dicing and/or thinning process, the microscopic characteristics of the damaged layer have not yet been investigated in detail. In this study, the microstructural characterization of a damaged layer was investigated by transmission electron microscopy. It was found that mechanical polishing introduced dislocation near the surface of the crystal. It was also found that the domain structure was affected by the introduction of dislocation.",

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T1 - Electron microscopic analysis of surface damaged layer in Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystal

AU - Kasuya, Yusuke

AU - Sato, Yukio

AU - Urakami, Ryosuke

AU - Yamada, Kazuhiro

AU - Teranishi, Ryo

AU - Kaneko, Kenji

PY - 2017/1

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N2 - Single crystals of lead magnesium niobate-lead titanate, Pb (Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT), have superior dielectric and piezoelectric properties suitable for medical ultrasound imaging. Imaging devices with superior performance can be manufactured from thinner PMN-PT single crystals by mechanical dicing and/or polishing. Although it is often a concern that a damaged layer may form during the mechanical dicing and/or thinning process, the microscopic characteristics of the damaged layer have not yet been investigated in detail. In this study, the microstructural characterization of a damaged layer was investigated by transmission electron microscopy. It was found that mechanical polishing introduced dislocation near the surface of the crystal. It was also found that the domain structure was affected by the introduction of dislocation.

AB - Single crystals of lead magnesium niobate-lead titanate, Pb (Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT), have superior dielectric and piezoelectric properties suitable for medical ultrasound imaging. Imaging devices with superior performance can be manufactured from thinner PMN-PT single crystals by mechanical dicing and/or polishing. Although it is often a concern that a damaged layer may form during the mechanical dicing and/or thinning process, the microscopic characteristics of the damaged layer have not yet been investigated in detail. In this study, the microstructural characterization of a damaged layer was investigated by transmission electron microscopy. It was found that mechanical polishing introduced dislocation near the surface of the crystal. It was also found that the domain structure was affected by the introduction of dislocation.

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