Electron microscopy investigation of structural transformations in tungsten oxide (WO 3) thin films

C. V. Ramana, S. Utsunomiya, R. C. Ewing, C. M. Julien, U. Becker

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

The phase transformations in tungsten oxide (WO 3) thin films have been investigated in the temperature range of 30-500°C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO 3 thin films occur in sequence exhibiting various crystal phases above room tem perature in the order: monoclinic → orthorhombic → hexagonal. The crystallographic distortions and tilting of the WO 6 octahedra are responsible for the phase transitions and significantly affect the electronic properties and, hence, the device applications of WO 3.

Original languageEnglish
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume202
Issue number10
DOIs
Publication statusPublished - Aug 1 2005
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Electron microscopy investigation of structural transformations in tungsten oxide (WO <sub>3</sub>) thin films'. Together they form a unique fingerprint.

Cite this