Electron microscopy of materials modification induced by tokamak plasma

Kazutoshi Tokunaga, T. Muroga, Y. Miyamoto, T. Fujiwara, N. Yoshida, K. Nakamura, N. Hiraki, S. Itoh

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.

Original languageEnglish
Pages (from-to)356-359
Number of pages4
JournalJournal of Nuclear Materials
Volume179-181
Issue numberPART 1
DOIs
Publication statusPublished - Jan 1 1991

Fingerprint

Electron microscopy
electron microscopy
Electron microscopes
Tokamak devices
electron microscopes
tokamak devices
Plasmas
Limiters
Beam plasma interactions
ejection
Molten materials
Hydrogen
damage
microstructure
Microstructure
Scanning electron microscopy
scanning electron microscopy
hydrogen
interactions
energy

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Materials Science(all)

Cite this

Tokunaga, K., Muroga, T., Miyamoto, Y., Fujiwara, T., Yoshida, N., Nakamura, K., ... Itoh, S. (1991). Electron microscopy of materials modification induced by tokamak plasma. Journal of Nuclear Materials, 179-181(PART 1), 356-359. https://doi.org/10.1016/0022-3115(91)90099-S

Electron microscopy of materials modification induced by tokamak plasma. / Tokunaga, Kazutoshi; Muroga, T.; Miyamoto, Y.; Fujiwara, T.; Yoshida, N.; Nakamura, K.; Hiraki, N.; Itoh, S.

In: Journal of Nuclear Materials, Vol. 179-181, No. PART 1, 01.01.1991, p. 356-359.

Research output: Contribution to journalArticle

Tokunaga, K, Muroga, T, Miyamoto, Y, Fujiwara, T, Yoshida, N, Nakamura, K, Hiraki, N & Itoh, S 1991, 'Electron microscopy of materials modification induced by tokamak plasma', Journal of Nuclear Materials, vol. 179-181, no. PART 1, pp. 356-359. https://doi.org/10.1016/0022-3115(91)90099-S
Tokunaga K, Muroga T, Miyamoto Y, Fujiwara T, Yoshida N, Nakamura K et al. Electron microscopy of materials modification induced by tokamak plasma. Journal of Nuclear Materials. 1991 Jan 1;179-181(PART 1):356-359. https://doi.org/10.1016/0022-3115(91)90099-S
Tokunaga, Kazutoshi ; Muroga, T. ; Miyamoto, Y. ; Fujiwara, T. ; Yoshida, N. ; Nakamura, K. ; Hiraki, N. ; Itoh, S. / Electron microscopy of materials modification induced by tokamak plasma. In: Journal of Nuclear Materials. 1991 ; Vol. 179-181, No. PART 1. pp. 356-359.
@article{a0b880d42c9e4280b17f44a7afd357e5,
title = "Electron microscopy of materials modification induced by tokamak plasma",
abstract = "In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.",
author = "Kazutoshi Tokunaga and T. Muroga and Y. Miyamoto and T. Fujiwara and N. Yoshida and K. Nakamura and N. Hiraki and S. Itoh",
year = "1991",
month = "1",
day = "1",
doi = "10.1016/0022-3115(91)90099-S",
language = "English",
volume = "179-181",
pages = "356--359",
journal = "Journal of Nuclear Materials",
issn = "0022-3115",
publisher = "Elsevier",
number = "PART 1",

}

TY - JOUR

T1 - Electron microscopy of materials modification induced by tokamak plasma

AU - Tokunaga, Kazutoshi

AU - Muroga, T.

AU - Miyamoto, Y.

AU - Fujiwara, T.

AU - Yoshida, N.

AU - Nakamura, K.

AU - Hiraki, N.

AU - Itoh, S.

PY - 1991/1/1

Y1 - 1991/1/1

N2 - In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.

AB - In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.

UR - http://www.scopus.com/inward/record.url?scp=0343423919&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0343423919&partnerID=8YFLogxK

U2 - 10.1016/0022-3115(91)90099-S

DO - 10.1016/0022-3115(91)90099-S

M3 - Article

AN - SCOPUS:0343423919

VL - 179-181

SP - 356

EP - 359

JO - Journal of Nuclear Materials

JF - Journal of Nuclear Materials

SN - 0022-3115

IS - PART 1

ER -