TY - JOUR
T1 - Electron tomography
T2 - An imaging method for materials deformation dynamics
AU - Hata, S.
AU - Honda, T.
AU - Saito, H.
AU - Mitsuhara, M.
AU - Petersen, T. C.
AU - Murayama, M.
N1 - Funding Information:
The authors thank the following people for their kind cooperation in conducting the research for this article: H. Nakashima (Kyushu University); K. Sato (Osaka University); H. Kudo (University of Tsukuba); S. Miyazaki (Thermo Fisher Scientific); T Gondo and H. Miyazaki (Mel-Build Corporation); H. Furukawa, N. Horii and K. Kawamoto (System in Frontier Inc.); M. Sakamoto and D. Hirakami (Nippon Steel Corporation). This work was supported by the following: The Japan Society for the Promotion of Science (JSPS)/Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan KAKENHI (JP25286027, JP18K18954, JP18H05479, JP19H02029, JP20H02426); Japan Science and Technology Agency (JST) CREST (#JPMJCR18J4, #JPMJCR1994); The JST “Development of systems and technology for advanced measurement and analysis” program; The MEXT “Advanced Research Network for Ultra-Microscopic Science” program; Iketani Science and Technology Foundation; Research and Education Center for Advanced Energy Materials, Devices and Systems, Kyushu University; The Virginia Tech National Center for Earth and Environmental Nanotechnology Infrastructure (NanoEarth), a member of the National Nanotechnology Coordinated Infrastructure (NNCI), supported by NSF (ECCS 1542100).
Funding Information:
This work was supported by the following: The Japan Society for the Promotion of Science (JSPS) / Ministry of Education, Culture, Sports, Science and Technology (MEXT) , Japan KAKENHI ( JP25286027 , JP18K18954 , JP18H05479 , JP19H02029 , JP20H02426 ); Japan Science and Technology Agency (JST) CREST ( #JPMJCR18J4 , #JPMJCR1994 ); The JST “Development of systems and technology for advanced measurement and analysis” program; The MEXT “Advanced Research Network for Ultra-Microscopic Science” program; Iketani Science and Technology Foundation ; Research and Education Center for Advanced Energy Materials, Devices and Systems , Kyushu University ; The Virginia Tech National Center for Earth and Environmental Nanotechnology Infrastructure (NanoEarth) , a member of the National Nanotechnology Coordinated Infrastructure (NNCI) , supported by NSF ( ECCS 1542100 ).
Publisher Copyright:
© 2020 The Author(s)
PY - 2020
Y1 - 2020
N2 - The combination of in-situ and three-dimensional (3D) in transmission electron microscopy (TEM) is one of the emerging topics of recent advanced electron microscopy research. However, to date, there have been only handful examples of in-situ 3D TEM for material deformation dynamics. In this article, firstly, the authors briefly review technical developments in fast tilt-series dataset acquisition, which is a crucial technique for in-situ electron tomography (ET). Secondly, the authors showcase a recent successful example of in-situ specimen-straining and ET system development and its applications to the deformation dynamics of crystalline materials. The system is designed and developed to explore, in real-time and at sub-microscopic levels, the internal behavior of polycrystalline materials subjected to external stresses, and not specifically targeted for atomic resolution (although it may be possible). Technical challenges toward the in-situ ET observation of 3D dislocation dynamics are discussed for commercial structural crystalline materials, including some of the early studies on in-situ ET imaging and 3D modeling of dislocation dynamics. A short summary of standing technical issues and a proposed guideline for further development in the 3D imaging method for dislocation dynamics are then discussed.
AB - The combination of in-situ and three-dimensional (3D) in transmission electron microscopy (TEM) is one of the emerging topics of recent advanced electron microscopy research. However, to date, there have been only handful examples of in-situ 3D TEM for material deformation dynamics. In this article, firstly, the authors briefly review technical developments in fast tilt-series dataset acquisition, which is a crucial technique for in-situ electron tomography (ET). Secondly, the authors showcase a recent successful example of in-situ specimen-straining and ET system development and its applications to the deformation dynamics of crystalline materials. The system is designed and developed to explore, in real-time and at sub-microscopic levels, the internal behavior of polycrystalline materials subjected to external stresses, and not specifically targeted for atomic resolution (although it may be possible). Technical challenges toward the in-situ ET observation of 3D dislocation dynamics are discussed for commercial structural crystalline materials, including some of the early studies on in-situ ET imaging and 3D modeling of dislocation dynamics. A short summary of standing technical issues and a proposed guideline for further development in the 3D imaging method for dislocation dynamics are then discussed.
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U2 - 10.1016/j.cossms.2020.100850
DO - 10.1016/j.cossms.2020.100850
M3 - Article
AN - SCOPUS:85089827497
VL - 24
JO - Current Opinion in Solid State and Materials Science
JF - Current Opinion in Solid State and Materials Science
SN - 1359-0286
IS - 4
M1 - 100850
ER -