Electron tomography of dislocation structures

G. S. Liu, S. D. House, J. Kacher, M. Tanaka, K. Higashida, I. M. Robertson

Research output: Contribution to journalShort surveypeer-review

24 Citations (Scopus)

Abstract

Recent developments in the application of electron tomography for characterizing microstructures in crystalline solids are described. The underlying principles for electron tomography are presented in the context of typical challenges in adapting the technique to crystalline systems and in using diffraction contrast imaging conditions. Methods for overcoming the limitations associated with the angular range, the number of acquired images, and uniformity of image contrast are introduced. In addition, a method for incorporating the real space coordinate system into the tomogram is presented. As the approach emphasizes development of experimental solutions to the challenges, the solutions developed and implemented are presented in the form of examples.

Original languageEnglish
Pages (from-to)1-11
Number of pages11
JournalMaterials Characterization
Volume87
DOIs
Publication statusPublished - 2014

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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