Electron tomography of dislocation structures

G. S. Liu, S. D. House, J. Kacher, M. Tanaka, K. Higashida, I. M. Robertson

    Research output: Contribution to journalShort surveypeer-review

    30 Citations (Scopus)

    Abstract

    Recent developments in the application of electron tomography for characterizing microstructures in crystalline solids are described. The underlying principles for electron tomography are presented in the context of typical challenges in adapting the technique to crystalline systems and in using diffraction contrast imaging conditions. Methods for overcoming the limitations associated with the angular range, the number of acquired images, and uniformity of image contrast are introduced. In addition, a method for incorporating the real space coordinate system into the tomogram is presented. As the approach emphasizes development of experimental solutions to the challenges, the solutions developed and implemented are presented in the form of examples.

    Original languageEnglish
    Pages (from-to)1-11
    Number of pages11
    JournalMaterials Characterization
    Volume87
    DOIs
    Publication statusPublished - 2014

    All Science Journal Classification (ASJC) codes

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

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