TY - JOUR
T1 - Electronic states and modulation doping of hexagonal boron nitride trilayers
AU - Haga, Taishi
AU - Matsuura, Yuuto
AU - Fujimoto, Yoshitaka
AU - Saito, Susumu
N1 - Funding Information:
This work was partly supported by the Elements Strategy Initiative to Form Core Research Center, Ministry of Education, Culture, Sports, Science and Technology (MEXT) through the Tokodai Institute for Element Strategy (Grant No. JPMXP0112101001) and Grants-in-Aid for Scientific Research from Japan Society for the Promotion of Science (JSPS) Grants No. JP17K05053, No. JP19H01823, No. JP21K04876, and No. JP25107005. Computations were partly done at the Supercomputer Center of the Institute for Solid State Physics, The University of Tokyo; at the Center for Computational Materials Science, Institute for Materials Research, Tohoku University for the use of MASAMUNE-IMR; and at the Global Scientific Information and Computing Center of the Tokyo Institute of Technology. T.H. also acknowledges the financial support from the Tokyo Tech Academy for Convergence of Materials and Informatics.
Funding Information:
Ministry of Education, Culture, Sports, Science and Technology Japan Society for the Promotion of Science Tokyo Institute of Technology
Publisher Copyright:
©2021 American Physical Society
PY - 2021/9
Y1 - 2021/9
N2 - We study the stabilities and geometric and electronic properties of hexagonal boron nitride trilayers by using first-principles electronic-structure calculations within the framework of the density functional theory. From the results of total-energy calculations, we reveal the relative stabilities for various stacking sequences of -BN trilayers. We also show that energy-band structures as well as spatial distributions of wave functions at the valence-band maximum (VBM) and the conduction-band minimum (CBM) strongly depend on the stacking sequences of the -BN trilayers. We further investigate the effects of substitutional doping of a carbon atom on the electronic properties of the -BN trilayers. In several stacking sequences of the C-doped -BN trilayers, we find that the C-atom dopant can be spatially separated from the carrier transport layers associated with the VBM or the CBM, suggesting the possibility of realizing conduction channels only weakly disturbed by the C-atom impurity in -BN trilayers. Interestingly, these donor states spatially separated from the CBM state are found to become rather shallow. This theoretical finding of “atomically thin modulation doping” using the -BN layers may open an important way to design future layered electronic device materials.
AB - We study the stabilities and geometric and electronic properties of hexagonal boron nitride trilayers by using first-principles electronic-structure calculations within the framework of the density functional theory. From the results of total-energy calculations, we reveal the relative stabilities for various stacking sequences of -BN trilayers. We also show that energy-band structures as well as spatial distributions of wave functions at the valence-band maximum (VBM) and the conduction-band minimum (CBM) strongly depend on the stacking sequences of the -BN trilayers. We further investigate the effects of substitutional doping of a carbon atom on the electronic properties of the -BN trilayers. In several stacking sequences of the C-doped -BN trilayers, we find that the C-atom dopant can be spatially separated from the carrier transport layers associated with the VBM or the CBM, suggesting the possibility of realizing conduction channels only weakly disturbed by the C-atom impurity in -BN trilayers. Interestingly, these donor states spatially separated from the CBM state are found to become rather shallow. This theoretical finding of “atomically thin modulation doping” using the -BN layers may open an important way to design future layered electronic device materials.
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U2 - 10.1103/PhysRevMaterials.5.094003
DO - 10.1103/PhysRevMaterials.5.094003
M3 - Article
AN - SCOPUS:85116383678
SN - 2475-9953
VL - 5
JO - Physical Review Materials
JF - Physical Review Materials
IS - 9
M1 - 094003
ER -