Electronic structures and redox properties of silylmethylated C60

Hideo Nagashima, Masayuki Saito, Yoshiyuki Kato, Hitoshi Goto, Eiji Osawa, Masaaki Haga, Kenji Itoh

Research output: Contribution to journal › Article

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Abstract

Theoretical and electrochemical studies were performed to understand the electronic structure and the redox property of two types of silylmethylated C60, C60(H)(CH2SiMe2Y) (1) and C60(CH2SiMe2Y)2 (2) [Y = alkyl, aryl, OR, F]. Semi-empirical molecular orbital (MO) calculations for 1a (Y = Me of 1) and 2a (Y = Me of 2), and their model compounds, C60(H)(Me) (3) and C60(Me)2 (4) revealed the thermodynamically most stable isomer of each compound. Cyclic voltammograms showed three to five reversible reduction waves and a quasi-reversible oxidation wave; the redox potentials are consistent with those expected from frontier orbital energies calculated by AM1.

Original languageEnglish
Pages (from-to)5053-5064
Number of pages12
JournalTetrahedron
Volume52
Issue number14
DOIs
Publication statusPublished - Apr 1 1996

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Oxidation-Reduction
Electronic structure
Orbital calculations
Molecular orbitals
Isomers
Theoretical Models
Oxidation
fullerene C60

All Science Journal Classification (ASJC) codes

  • Biochemistry
  • Drug Discovery
  • Organic Chemistry

Cite this

Nagashima, H., Saito, M., Kato, Y., Goto, H., Osawa, E., Haga, M., & Itoh, K. (1996). Electronic structures and redox properties of silylmethylated C60. Tetrahedron, 52(14), 5053-5064. https://doi.org/10.1016/0040-4020(96)00113-5

Electronic structures and redox properties of silylmethylated C60. / Nagashima, Hideo; Saito, Masayuki; Kato, Yoshiyuki; Goto, Hitoshi; Osawa, Eiji; Haga, Masaaki; Itoh, Kenji.

In: Tetrahedron, Vol. 52, No. 14, 01.04.1996, p. 5053-5064.

Research output: Contribution to journal › Article

Nagashima, H, Saito, M, Kato, Y, Goto, H, Osawa, E, Haga, M & Itoh, K 1996, 'Electronic structures and redox properties of silylmethylated C60', Tetrahedron, vol. 52, no. 14, pp. 5053-5064. https://doi.org/10.1016/0040-4020(96)00113-5
Nagashima H, Saito M, Kato Y, Goto H, Osawa E, Haga M et al. Electronic structures and redox properties of silylmethylated C60. Tetrahedron. 1996 Apr 1;52(14):5053-5064. https://doi.org/10.1016/0040-4020(96)00113-5
Nagashima, Hideo ; Saito, Masayuki ; Kato, Yoshiyuki ; Goto, Hitoshi ; Osawa, Eiji ; Haga, Masaaki ; Itoh, Kenji. / Electronic structures and redox properties of silylmethylated C60. In: Tetrahedron. 1996 ; Vol. 52, No. 14. pp. 5053-5064.
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