Emission zone measurement gives insight into the suitability of accelerated ageing extrapolation

R. Mac Ciarnáin, H. W. Mo, K. Nagayoshi, H. Fujimoto, K. Harada, T. H. Ke, P. Heremans, C. Adachi

Research output: Contribution to journalConference articlepeer-review

Abstract

Accelerated OLED ageing at higher current densities is commonly used to extrapolate lower current density device lifetime benchmarks. Different emission zones and device ageing were measured at different current densities giving more insight into the suitability of such accelerated ageing assumptions.

Original languageEnglish
Pages (from-to)415-418
Number of pages4
JournalProceedings of the International Display Workshops
Volume27
Publication statusPublished - Dec 9 2021
Event27th International Display Workshops, IDW 2020 - Virtual, Online
Duration: Dec 9 2020Dec 11 2020

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition
  • Human-Computer Interaction
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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