Energy filtering transmission electron microscopy using the new JEM- 2010FEF

Y. Tomokiyo, Syo Matsumura, T. Manabe

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

The new JEM-2010FEF electron microscope provides useful techniques based on energy filtering as an omega-type energy filter is integrated into a thermal field-emission 200 kV transmission electron microscope. For example, the zero-loss imaging improves the contrast of high resolution lattice images as well as images of precipitates or lattice defects in alloys. The acquisition time for elemental mapping with core-loss electrons is one order in magnitude shorter than with energy-dispersive X-ray spectroscopy. The removal of inelastically scattered electrons enables us to observe weak lines in convergent-beam electron diffraction patterns from a thicker specimen with a probe size 1-2 nm in diameter. A combination of the field emission gun and sensitive recording media such as an imaging plate and a slow-scan CCD camera makes the energy filtering more powerful.

Original languageEnglish
Pages (from-to)210-218
Number of pages9
JournalJournal of Microscopy
Volume194
Issue number1
DOIs
Publication statusPublished - Jan 1 1999

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Energy-Filtering Transmission Electron Microscopy
Electrons
X-Ray Emission Spectrometry
Firearms
Hot Temperature

All Science Journal Classification (ASJC) codes

  • Pathology and Forensic Medicine
  • Histology

Cite this

Energy filtering transmission electron microscopy using the new JEM- 2010FEF. / Tomokiyo, Y.; Matsumura, Syo; Manabe, T.

In: Journal of Microscopy, Vol. 194, No. 1, 01.01.1999, p. 210-218.

Research output: Contribution to journalArticle

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