Energy-resolved depth profiling of metal-polymer interfaces using dynamic quadrupole secondary ion mass spectrometry

Helena Téllez, José M. Vadillo, J. Javier Laserna

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    Quadrupole secondary ion mass spectrometry (qSIMS) characterization of a metallized polypropylene film used in the manufacturing of capacitors has been performed. Ar+ primary ions were used to preserve the oxidation state of the surface. The sample exhibits an incomplete metallization that made it difficult to determine the exact location of the metal-polymer interface due to the simultaneous contribution of ions with identical m/z values from the metallic and the polymer layers. Energy filtering by means of a 45° electrostatic analyzer allowed resolution of the metal-polymer interface by selecting a suitable kinetic energy corresponding to the ions generated in the metallized layer but not from the polymer. Under these conditions, selective analyses of isobaric interferences such as 27A1+ and 27C2H+3 or 43A1O + and 43C3H+7 have been successfully performed.

    Original languageEnglish
    Pages (from-to)2357-2362
    Number of pages6
    JournalRapid Communications in Mass Spectrometry
    Volume23
    Issue number15
    DOIs
    Publication statusPublished - Aug 15 2009

    All Science Journal Classification (ASJC) codes

    • Analytical Chemistry
    • Spectroscopy
    • Organic Chemistry

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