Energydispersive x-ray microanalysis in the analytical electron microscope

Zenji Horita, Takeshi Sano, Minoru Nemoto

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

A review is made on the quantitative microanalysis of thin samples in the analytical electron microscope (AEM) with the energy dispersive spectrometer (EDS). This review is concerned with a basic approach to the quantification and some applications to Ni base alloys. Covered first are the simplicity of the ratio method for the microanalysis of thin samples and the importance of the experimental determination of /c-factors needed in the ratio method. The way to estimate the effects of X-ray absorption and fluorescence is described by having examples from two typical Ni base alloys. For the correction of absorption, two methods are raised; one is the extrapolation method and the other is the differential X-ray absorption (DXA) method, both of which do not require the thickness measurement. Application to a unidirectionally solidified Ni-AI-Mo eutectic alloy is demonstrated, where the calculation of the minimum mass fraction (MMF) is included. Finally, a simple technique is shown to identify the particles of which sizes are smaller than the electron probe size.

Original languageEnglish
Pages (from-to)179-190
Number of pages12
Journalisij international
Volume29
Issue number3
DOIs
Publication statusPublished - Jan 1 1989

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Microanalysis
Electron microscopes
X ray absorption
X rays
Thickness measurement
Extrapolation
Eutectics
Spectrometers
Fluorescence
Electrons

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Cite this

Energydispersive x-ray microanalysis in the analytical electron microscope. / Horita, Zenji; Sano, Takeshi; Nemoto, Minoru.

In: isij international, Vol. 29, No. 3, 01.01.1989, p. 179-190.

Research output: Contribution to journalArticle

Horita, Zenji ; Sano, Takeshi ; Nemoto, Minoru. / Energydispersive x-ray microanalysis in the analytical electron microscope. In: isij international. 1989 ; Vol. 29, No. 3. pp. 179-190.
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