Enhanced proton conductivity of amorphous silicate nanofilms

Y. Aoki, H. Habazakia, T. Kunitake

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

AlxSi1-xOn, films exhibit a drastic change of proton conductivity across the film by reducing its thickness to less than 100 nm. The temperature- and humidity-dependence of conductivity of the sub-100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-xOn, films increases with decreasing the thickness.

Original languageEnglish
Title of host publicationECS Transactions - Solid State Ionic Devices 6 - Nanoionics - 214th ECS Meeting
Pages407-412
Number of pages6
Edition51
DOIs
Publication statusPublished - Dec 1 2008
EventSolid State Ionic Devices 6 - Nanoionics - 214th ECS Meeting - Honolulu, HI, United States
Duration: Oct 12 2008Oct 17 2008

Publication series

NameECS Transactions
Number51
Volume16
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Other

OtherSolid State Ionic Devices 6 - Nanoionics - 214th ECS Meeting
CountryUnited States
CityHonolulu, HI
Period10/12/0810/17/08

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Aoki, Y., Habazakia, H., & Kunitake, T. (2008). Enhanced proton conductivity of amorphous silicate nanofilms. In ECS Transactions - Solid State Ionic Devices 6 - Nanoionics - 214th ECS Meeting (51 ed., pp. 407-412). (ECS Transactions; Vol. 16, No. 51). https://doi.org/10.1149/1.3242255