Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer

Reiji Hattori, Yukio Aoki, Takeshi Sugano, Junji Shirafuji, Tsuyoshi Fujiki

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1-5 μm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c-axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.

Original languageEnglish
Pages (from-to)819-823
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Volume36
Issue number2
Publication statusPublished - 1997
Externally publishedYes

Fingerprint

polytetrafluoroethylene
Polytetrafluoroethylenes
Epitaxial growth
grooves
Diffraction patterns
Absorption spectra
diffraction patterns
absorption spectra
X ray diffraction
Substrates
Atomic force microscopy
Evaporation
Microscopes
x rays
Crystal structure
microscopes
evaporation
atomic force microscopy
crystal structure

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)
  • Engineering(all)

Cite this

Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer. / Hattori, Reiji; Aoki, Yukio; Sugano, Takeshi; Shirafuji, Junji; Fujiki, Tsuyoshi.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, Vol. 36, No. 2, 1997, p. 819-823.

Research output: Contribution to journalArticle

@article{f5f4df2aa89c4c2883ebfc7df7353aab,
title = "Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer",
abstract = "Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1-5 μm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c-axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.",
author = "Reiji Hattori and Yukio Aoki and Takeshi Sugano and Junji Shirafuji and Tsuyoshi Fujiki",
year = "1997",
language = "English",
volume = "36",
pages = "819--823",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Institute of Physics",
number = "2",

}

TY - JOUR

T1 - Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer

AU - Hattori, Reiji

AU - Aoki, Yukio

AU - Sugano, Takeshi

AU - Shirafuji, Junji

AU - Fujiki, Tsuyoshi

PY - 1997

Y1 - 1997

N2 - Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1-5 μm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c-axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.

AB - Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1-5 μm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c-axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.

UR - http://www.scopus.com/inward/record.url?scp=0031072657&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031072657&partnerID=8YFLogxK

M3 - Article

VL - 36

SP - 819

EP - 823

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 2

ER -