Erratum: Comparison of the frequency of T-cell receptor mutants and thioguanine resistance induced by X-rays and ethylnitrosourea in cultured human blood T-lymphocytes (Mutation Research 357 (1996) (191-197)) PIIS0027510796001017

N. Mei; N. Kunugita; S. Nomoto; T. Norimura

doi:10.1016/S0027-5107(96)00233-3

Erratum: Comparison of the frequency of T-cell receptor mutants and thioguanine resistance induced by X-rays and ethylnitrosourea in cultured human blood T-lymphocytes (Mutation Research 357 (1996) (191-197)) PIIS0027510796001017

N. Mei, N. Kunugita, S. Nomoto, T. Norimura

Faculty of Medical Sciences

Research output: Contribution to journal › Comment/debate

Original language	English
Number of pages	1
Journal	Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis
Volume	374
Issue number	1
DOIs	https://doi.org/10.1016/S0027-5107(96)00233-3
Publication status	Published - Jan 1 1997

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All Science Journal Classification (ASJC) codes

Molecular Biology
Genetics
Health, Toxicology and Mutagenesis

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Mei, N., Kunugita, N., Nomoto, S., & Norimura, T. (1997). Erratum: Comparison of the frequency of T-cell receptor mutants and thioguanine resistance induced by X-rays and ethylnitrosourea in cultured human blood T-lymphocytes (Mutation Research 357 (1996) (191-197)) PIIS0027510796001017. Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis, 374(1). https://doi.org/10.1016/S0027-5107(96)00233-3

Erratum : Comparison of the frequency of T-cell receptor mutants and thioguanine resistance induced by X-rays and ethylnitrosourea in cultured human blood T-lymphocytes (Mutation Research 357 (1996) (191-197)) PIIS0027510796001017. / Mei, N.; Kunugita, N.; Nomoto, S.; Norimura, T.

In: Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis, Vol. 374, No. 1, 01.01.1997.

Research output: Contribution to journal › Comment/debate

Mei, N, Kunugita, N, Nomoto, S & Norimura, T 1997, 'Erratum: Comparison of the frequency of T-cell receptor mutants and thioguanine resistance induced by X-rays and ethylnitrosourea in cultured human blood T-lymphocytes (Mutation Research 357 (1996) (191-197)) PIIS0027510796001017', Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis, vol. 374, no. 1. https://doi.org/10.1016/S0027-5107(96)00233-3

Mei N, Kunugita N, Nomoto S, Norimura T. Erratum: Comparison of the frequency of T-cell receptor mutants and thioguanine resistance induced by X-rays and ethylnitrosourea in cultured human blood T-lymphocytes (Mutation Research 357 (1996) (191-197)) PIIS0027510796001017. Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis. 1997 Jan 1;374(1). https://doi.org/10.1016/S0027-5107(96)00233-3

Mei, N. ; Kunugita, N. ; Nomoto, S. ; Norimura, T. / Erratum : Comparison of the frequency of T-cell receptor mutants and thioguanine resistance induced by X-rays and ethylnitrosourea in cultured human blood T-lymphocytes (Mutation Research 357 (1996) (191-197)) PIIS0027510796001017. In: Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis. 1997 ; Vol. 374, No. 1.

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10.1016/S0027-5107(96)00233-3