Erratum: "Degradation analysis of 2 μm DFB laser using optical beam induced current technique" (IEEE Transactions on Electron Devices)

Tatsuya Takeshita, Tomonari Sato, Manabu Mitsuhara, Yasuhiro Kondo, Mitsuru Sugo, Kazutoshi Kato

Research output: Contribution to journalComment/debate

Original languageEnglish
Number of pages1
JournalIEEE Transactions on Electron Devices
Volume55
Issue number2
DOIs
Publication statusPublished - Feb 1 2008
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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