ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier

K. Hasegawa, S. Nishizawa, I. Omura

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Condition monitoring plays an important role in estimating health condition of capacitors because the ageing of the capacitors is usually accompanied by an increase in equivalent series resistance (ESR) and a decrease in capacitance. Either capacitance or ESR cannot be a unique indicator of the lifetime of capacitors in some cases. This paper presents a condition monitoring method of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier intended for motor drives. The monitoring method extracts both the ESR and capacitance of a capacitor under test from the actual ripple current and voltage without disconnecting the capacitor nor injecting an additional current. The monitoring method, therefore, can be implemented online. Experimental results verify that the monitoring method independently obtains the ESR and capacitance changes of the capacitor under test. This contributes to accurate lifetime estimation of dc-link capacitors.

Original languageEnglish
Pages (from-to)433-437
Number of pages5
JournalMicroelectronics Reliability
Volume88-90
DOIs
Publication statusPublished - Sep 2018

Fingerprint

pulse duration modulation
rectifiers
Pulse width modulation
capacitors
Diodes
Capacitors
Capacitance
capacitance
diodes
Monitoring
Condition monitoring
life (durability)
ripples
health
estimating
Aging of materials
Health
Electric potential
electric potential

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Cite this

ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier. / Hasegawa, K.; Nishizawa, S.; Omura, I.

In: Microelectronics Reliability, Vol. 88-90, 09.2018, p. 433-437.

Research output: Contribution to journalArticle

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