Essential structure of S-N curve: Prediction of fatigue life and fatigue limit of defective materials and nature of scatter

Yukitaka Murakami, Toshio Takagi, Kentaro Wada, Hisao Matsunaga

Research output: Contribution to journalArticlepeer-review

Abstract

Historically, S-N curve has been expressed in the form of an exponential relationship between applied stress σ and number of cycles to failure Nf. This paper elucidates the essential structure of S-N curve based on the prediction method for fatigue life and limit of materials containing defects from the viewpoint of mechanics of small crack. The extended application of the proposed method to step loading and variable amplitude loading is discussed. The question about the applicability of Miner's rule is also discussed from the viewpoint of continuous decrease in fatigue limit with number of stress cycles and crack growth.

Original languageEnglish
Article number106138
JournalInternational Journal of Fatigue
Volume146
DOIs
Publication statusPublished - May 2021

All Science Journal Classification (ASJC) codes

  • Modelling and Simulation
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

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