Establishing traceability between requirements, design and operation information in lifecycle-oriented architecture

Shota Ishibashi, Hisazumi Kenji, Tsuneo Nakanishi, Akira Fukuda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Many uncertainties arise in system development as systems can be complex and large-scale and can be deployed in an uncertain environment. Developers cannot determine some types of uncertainties until the start of an operation. To deal with changing requirements and environments owing to these uncertainties, we must build an architecture that takes operations into account within a system development lifecycle. In this paper, a lifecycle-oriented development process is proposed to improve the uncertainties of requirement and design. As a case study, we apply the proposed method to the development of Patrash, a transfer guide application.

Original languageEnglish
Title of host publicationProceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages234-239
Number of pages6
ISBN (Electronic)9781467389853
DOIs
Publication statusPublished - Aug 31 2016
Event5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016 - Kumamoto, Japan
Duration: Jul 10 2016Jul 14 2016

Other

Other5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016
CountryJapan
CityKumamoto
Period7/10/167/14/16

All Science Journal Classification (ASJC) codes

  • Information Systems
  • Computer Networks and Communications
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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    Ishibashi, S., Kenji, H., Nakanishi, T., & Fukuda, A. (2016). Establishing traceability between requirements, design and operation information in lifecycle-oriented architecture. In Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016 (pp. 234-239). [7557609] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IIAI-AAI.2016.172