Estimating error in measuring thermal conductivity using a T-type nanosensor

Yohei Ito; Koji Takahashi; Motoo Fujii; Xing Zhang

doi:10.1002/htj.20228

Estimating error in measuring thermal conductivity using a T-type nanosensor

Yohei Ito, Koji Takahashi, Motoo Fujii, Xing Zhang

Thermophysics and Fluid Mechanics

Research output: Contribution to journal › Article

4 Citations (Scopus)

Abstract

We discuss the measurement error caused by fabrication and measurement of a T-type nanosensor with a suspended sub-micrometer Pt hot film that was developed to measure the thermal properties of individual nanowire materials. Comparison of numerical simulation and one-dimensional analysis revealed that the thermal conductivity of nanowire material such as a carbon nanotube is calculated to be 17% lower. As an example, the thermal conductivity measurement result for a SiC nanowire is reported. The error caused by contact thermal resistance is found to depend on the contact length and can be as great as 20%. It can be said that future measuring can have higher reliability by correcting the estimated measurement error.

Original language	English
Pages (from-to)	297-312
Number of pages	16
Journal	Heat Transfer - Asian Research
Volume	38
Issue number	5
DOIs	https://doi.org/10.1002/htj.20228
Publication status	Published - Jul 1 2009

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All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Fluid Flow and Transfer Processes

Cite this

Ito, Y., Takahashi, K., Fujii, M., & Zhang, X. (2009). Estimating error in measuring thermal conductivity using a T-type nanosensor. Heat Transfer - Asian Research, 38(5), 297-312. https://doi.org/10.1002/htj.20228

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Access to Document

10.1002/htj.20228