Abstract
We discuss the measurement error caused by fabrication and measurement of a T-type nanosensor with a suspended sub-micrometer Pt hot film that was developed to measure the thermal properties of individual nanowire materials. Comparison of numerical simulation and one-dimensional analysis revealed that the thermal conductivity of nanowire material such as a carbon nanotube is calculated to be 17% lower. As an example, the thermal conductivity measurement result for a SiC nanowire is reported. The error caused by contact thermal resistance is found to depend on the contact length and can be as great as 20%. It can be said that future measuring can have higher reliability by correcting the estimated measurement error.
Original language | English |
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Pages (from-to) | 297-312 |
Number of pages | 16 |
Journal | Heat Transfer - Asian Research |
Volume | 38 |
Issue number | 5 |
DOIs | |
Publication status | Published - Jul 1 2009 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Fluid Flow and Transfer Processes