Estimation of organic molecular film structures using surface-plasmon resonance spectroscopy

Minniu Zhou, Akira Otomo, Shiyoshi Yokoyama, Shinro Mashiko

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Near-infrared surface-plasmon resonance (SPR) spectroscopy can be used to determine the thickness of single organic molecular films and the permittivities of organic materials with a high degree of sensitivity. The two-wavelength SPR method with one NIR and one visible light probes was used to improve the accuracy of our experiment. Structures of organic molecules on various substrates were investigated. Particular attention was focused on the error in the measuring of thickness, which was caused by the surface roughness of the substrate. The effect of this was determined by AFM observations. The error in measurement caused by a rough substrate was, thus, estimated.

Original languageEnglish
Pages (from-to)114-118
Number of pages5
JournalThin Solid Films
Volume393
Issue number1-2
DOIs
Publication statusPublished - Aug 1 2001
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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