Abstract
We examine the temperature dependence of the Eu valence and lattice parameters for Eu(Pd1-x Ptx)2Si2 by means of x-ray absorption spectroscopy (XAS) and x-ray diffraction, respectively. Strong temperature dependence of the Eu valence was observed for Eu(Pd1-xPtx)2Si2. Combining the Moessbauer effect data and XAS results, we estimated the Eu valence as a function of temperature. It is shown that the Eu valence in the ground state shows very little sensitivity to x for 0≤x≤0.10. In the temperature dependence of the Eu valence, the compound with x = 0.05 undergoes a continuous valence change, while the one with x = 0.15 shows a first-order valence transition. The factors determining the Eu valence in Eu(Pd1-xPtx)2Si2 are discussed.
Original language | English |
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Pages (from-to) | 5287-5296 |
Number of pages | 10 |
Journal | Journal of Physics Condensed Matter |
Volume | 12 |
Issue number | 24 |
DOIs | |
Publication status | Published - Jun 19 2000 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics