Abstract
We examine the temperature dependence of the Eu valence and lattice parameters for Eu(Pd1-x Ptx)2Si2 by means of x-ray absorption spectroscopy (XAS) and x-ray diffraction, respectively. Strong temperature dependence of the Eu valence was observed for Eu(Pd1-xPtx)2Si2. Combining the Moessbauer effect data and XAS results, we estimated the Eu valence as a function of temperature. It is shown that the Eu valence in the ground state shows very little sensitivity to x for 0≤x≤0.10. In the temperature dependence of the Eu valence, the compound with x = 0.05 undergoes a continuous valence change, while the one with x = 0.15 shows a first-order valence transition. The factors determining the Eu valence in Eu(Pd1-xPtx)2Si2 are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 5287-5296 |
| Number of pages | 10 |
| Journal | Journal of Physics Condensed Matter |
| Volume | 12 |
| Issue number | 24 |
| DOIs | |
| Publication status | Published - Jun 19 2000 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
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Mitsuda, A., Wada, H., Shiga, M., & Tanaka, T. (2000). Eu valence state and valence transition in Eu(Pd1-xPtx)2Si2. Journal of Physics Condensed Matter, 12(24), 5287-5296. https://doi.org/10.1088/0953-8984/12/24/317