Evaluation of gamma ray durability of RF tag and application to the radiation environment

Nobuyuki Teraura, Kunio Ito, Daisuke Kobayashi, Kouichi Sakurai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

As for common RF tag, the circuitry operator part is formed with the semiconductor. Then, when radiation, such as a gamma ray, is irradiated, a recoverable soft error and unrecoverable hard error will occur. Therefore, it cannot be used depending on the exposure dose of radiation. However, a radiation-proof ability can be raised by incorporating a shielding and an error correction. Then, RF tag which covered was irradiated with the gamma ray originating in Cesium 137 or Cobalt 60 grade, and the durability was evaluated. The application which uses this radiation-proof RF tag under radiation environment is proposed. They are management of the radioactive component generated from radioactive waste or a decommissioning process to improve the traceability, etc. Moreover, the evaluation result of RF tag used for management of the medical relationship instrument which performs gamma sterilization is described.

Original languageEnglish
Title of host publication2015 IEEE International Conference on RFID Technology and Applications, RFID-TA 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages147-152
Number of pages6
ISBN (Electronic)9781479979899
DOIs
Publication statusPublished - Jan 12 2016
EventIEEE International Conference on RFID Technology and Applications, RFID-TA 2015 - Tokyo, Japan
Duration: Sep 16 2015Sep 18 2015

Publication series

Name2015 IEEE International Conference on RFID Technology and Applications, RFID-TA 2015

Other

OtherIEEE International Conference on RFID Technology and Applications, RFID-TA 2015
CountryJapan
CityTokyo
Period9/16/159/18/15

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation

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  • Cite this

    Teraura, N., Ito, K., Kobayashi, D., & Sakurai, K. (2016). Evaluation of gamma ray durability of RF tag and application to the radiation environment. In 2015 IEEE International Conference on RFID Technology and Applications, RFID-TA 2015 (pp. 147-152). [7379809] (2015 IEEE International Conference on RFID Technology and Applications, RFID-TA 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RFID-TA.2015.7379809