Evaluations of minority carrier lifetime in floating zone Si affected by Si insulated gate bipolar transistor processes

Hiroto Kobayashi, Ryo Yokogawa, Kosuke Kinoshita, Yohichiroh Numasawa, Atsushi Ogura, Shinichi Nishizawa, Takuya Saraya, Kazuo Ito, Toshihiko Takakura, Shin Ichi Suzuki, Munetoshi Fukui, Kiyoshi Takeuchi, Toshiro Hiramoto

Research output: Contribution to journalArticle

Abstract

This study evaluates minority carrier lifetime in floating zone Si affected by advanced and conventional Si IGBT (insulated gate bipolar transistor) processes. Si gate oxidations reduce lifetime due to the formation of interface states between the Si and the oxide. As a result, cross-sectional photoluminescence imaging shows that the lifetime around a trench is lower than that in the bulk region. The high temperature thermal treatment for B-base/P-emitter layer activation after gate oxidation improved the interface, thus resulting in the recovery of the lifetime. TEM observations reveal that the (110) trench surface shows irregular contrast while the (100) surface shows relatively smooth contrast, which is consistent with the lifetime result of "trench side wall surface (100)" > "trench side wall surface (110)." Our study conclusively clarifies that lifetime is correlated with the SiO2 surface state.

Original languageEnglish
Article numberSBBD07
JournalJapanese Journal of Applied Physics
Volume58
Issue number59
DOIs
Publication statusPublished - Jan 1 2019

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Carrier lifetime
Insulated gate bipolar transistors (IGBT)
carrier lifetime
bipolar transistors
minority carriers
floating
life (durability)
evaluation
Oxidation
Interface states
Surface states
oxidation
Photoluminescence
Chemical activation
Heat treatment
Transmission electron microscopy
Imaging techniques
emitters
Recovery
Oxides

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Evaluations of minority carrier lifetime in floating zone Si affected by Si insulated gate bipolar transistor processes. / Kobayashi, Hiroto; Yokogawa, Ryo; Kinoshita, Kosuke; Numasawa, Yohichiroh; Ogura, Atsushi; Nishizawa, Shinichi; Saraya, Takuya; Ito, Kazuo; Takakura, Toshihiko; Suzuki, Shin Ichi; Fukui, Munetoshi; Takeuchi, Kiyoshi; Hiramoto, Toshiro.

In: Japanese Journal of Applied Physics, Vol. 58, No. 59, SBBD07, 01.01.2019.

Research output: Contribution to journalArticle

Kobayashi, H, Yokogawa, R, Kinoshita, K, Numasawa, Y, Ogura, A, Nishizawa, S, Saraya, T, Ito, K, Takakura, T, Suzuki, SI, Fukui, M, Takeuchi, K & Hiramoto, T 2019, 'Evaluations of minority carrier lifetime in floating zone Si affected by Si insulated gate bipolar transistor processes', Japanese Journal of Applied Physics, vol. 58, no. 59, SBBD07. https://doi.org/10.7567/1347-4065/aafd90
Kobayashi, Hiroto ; Yokogawa, Ryo ; Kinoshita, Kosuke ; Numasawa, Yohichiroh ; Ogura, Atsushi ; Nishizawa, Shinichi ; Saraya, Takuya ; Ito, Kazuo ; Takakura, Toshihiko ; Suzuki, Shin Ichi ; Fukui, Munetoshi ; Takeuchi, Kiyoshi ; Hiramoto, Toshiro. / Evaluations of minority carrier lifetime in floating zone Si affected by Si insulated gate bipolar transistor processes. In: Japanese Journal of Applied Physics. 2019 ; Vol. 58, No. 59.
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