Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system

Hiroki Ogawa, Hiroyasu Masunaga, Sono Sasaki, Shunji Goto, Takashi Tanaka, Takamitsu Seike, Sunao Takahashi, Kunikazu Takeshita, Nobuteru Nariyama, Haruhiko Ohashi, Toru Ohata, Yukito Furukawa, Tomohiro Matsushita, Yasuhide Ishizawa, Naoto Yagi, Masaki Takata, Hideo Kitamura, Atsushi Takahara, Kazuo Sakurai, Kohji TashiroToshiji Kanaya, Yoshiyuki Amemiya, Kazuyuki Horie, Mikihito Takenaka, Hiroshi Jinnai, Hiroshi Okuda, Isamu Akiba, Isao Takahashi, Katsuhiro Yamamoto, Masamichi Hikosaka, Shinichi Sakurai, Yuya Shinohara, Yasunori Sugihara, Akihiko Okada

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

To gain a better understanding of the function of soft-material thin films, one should investigate the multiscale structural information from the surface roughness down to the atomically truncated structures at microarea. To achieve such an integrated investigation, a new experimental system has been launched by coupling with the measurement techniques, which include grazing incidence small/wide-angle X-ray scattering (GISWAXS) and grazing incidence X-ray diffraction (GIXD), as well as X-ray reflectivity (XR), at the BL03XU beamline of SPring-8. The high brilliance and low divergence beam allows the surface and interface structure measurements from the angstrom to the micrometer scale using a soller-slit system for proper optimization of measurement precision. A typical structural analysis of the soft-material film was performed to evaluate the practical performance and specifications of the experimental system.

Original languageEnglish
Pages (from-to)109-116
Number of pages8
JournalPolymer Journal
Volume45
Issue number1
DOIs
Publication statusPublished - Jan 1 2013

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All Science Journal Classification (ASJC) codes

  • Polymers and Plastics
  • Materials Chemistry

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