Measurement method of the interfacial thermal resistance (ITR) between a multi-walled carbon nanotube (MWCNT) and solid surface is developed by using a sub-micrometer Pt hot-film. Thermal application of CNTs is promising due to their very high intrinsic thermal conductivity. However ITR could be dominant in the total thermal resistance when CNT is used for heat dissipation devices. Therefore measuring ITR between CNT and solid material is important in order to determine the total thermal resistance. Though it is fundamental to understand the ITR in nano or atomic scale, there have been reported very few experimental approaches to measure the ITR due to technical difficulties. By using a MWCNT as a probe on the Pt hot-film, it is concluded that the ITR between MWCNT tip and SiO2 surface is 1 × 105 K/W, which is confirmed to be independent of contact pressure.
|Number of pages||8|
|Journal||Nihon Kikai Gakkai Ronbunshu, B Hen/Transactions of the Japan Society of Mechanical Engineers, Part B|
|Publication status||Published - Jan 1 2010|
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Mechanical Engineering