Fabrication and measurement of a Nb based superconducting single electron transistor

Yuichi Harada, D. B. Haviland, P. Delsing, C. D. Chen, T. Claeson

Research output: Contribution to journalArticle

44 Citations (Scopus)

Abstract

A new four-layer resist system was developed to fabricate small capacitance niobium tunnel junctions. Nb/AlO x /Al junctions were used to make a superconducting single electron transistor composed of two dc SQUIDs in series. The current-voltage characteristics were measured and two types of resonant tunneling of Cooper pairs were observed at different magnetic fields.

Original languageEnglish
Pages (from-to)636-638
Number of pages3
JournalApplied Physics Letters
Volume65
Issue number5
DOIs
Publication statusPublished - Dec 1 1994
Externally publishedYes

Fingerprint

single electron transistors
resonant tunneling
tunnel junctions
niobium
capacitance
fabrication
electric potential
magnetic fields

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Fabrication and measurement of a Nb based superconducting single electron transistor. / Harada, Yuichi; Haviland, D. B.; Delsing, P.; Chen, C. D.; Claeson, T.

In: Applied Physics Letters, Vol. 65, No. 5, 01.12.1994, p. 636-638.

Research output: Contribution to journalArticle

Harada, Yuichi ; Haviland, D. B. ; Delsing, P. ; Chen, C. D. ; Claeson, T. / Fabrication and measurement of a Nb based superconducting single electron transistor. In: Applied Physics Letters. 1994 ; Vol. 65, No. 5. pp. 636-638.
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