TY - JOUR
T1 - Fabrication of <1 1 0> oriented tungsten nano-tips by field-assisted water etching
AU - Onoda, Jo
AU - Mizuno, Seigi
N1 - Funding Information:
The authors thank the support from Prof. Hiroki Ago ( Institute for Materials Chemistry and Engineering, Kyushu University ) for SEM and STEM.
Copyright:
Copyright 2019 Elsevier B.V., All rights reserved.
PY - 2011/8/1
Y1 - 2011/8/1
N2 - We report the field-assisted H 2 O etching that enabled us to fabricate nano-tips from polycrystalline <1 1 0> oriented tungsten wires at room temperature. We optimized the sharpening procedure in order to obtain field emissions (FEs) with high collimation. The typical tip apex was composed of a large base and a nano-protrusion with a radius of curvature less than 3.5 . The narrowest opening angle (full width at half maximum) of the FE was 4.3° at 150 pA. We prepared two types of tips using two different applied bias voltages during the H 2 O etching. The electron microscope images and the analysis of Fowler-Nordheim (FN) plots revealed that the sizes of the individual bases depended on the fixed bias voltages during the H 2 O etching and affected their FE properties. In addition, we could confirm that the FE current from the nano-tip was more stable than that of the normal tip.
AB - We report the field-assisted H 2 O etching that enabled us to fabricate nano-tips from polycrystalline <1 1 0> oriented tungsten wires at room temperature. We optimized the sharpening procedure in order to obtain field emissions (FEs) with high collimation. The typical tip apex was composed of a large base and a nano-protrusion with a radius of curvature less than 3.5 . The narrowest opening angle (full width at half maximum) of the FE was 4.3° at 150 pA. We prepared two types of tips using two different applied bias voltages during the H 2 O etching. The electron microscope images and the analysis of Fowler-Nordheim (FN) plots revealed that the sizes of the individual bases depended on the fixed bias voltages during the H 2 O etching and affected their FE properties. In addition, we could confirm that the FE current from the nano-tip was more stable than that of the normal tip.
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U2 - 10.1016/j.apsusc.2011.04.124
DO - 10.1016/j.apsusc.2011.04.124
M3 - Article
AN - SCOPUS:79959334640
VL - 257
SP - 8427
EP - 8432
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 20
ER -