Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters

M. Uchida, Y. Toyota, H. Nakamura, S. Sagara, K. Kumamara, K. Wada, Junichi Murata

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A failure diagnosis system is proposed which can deal with large-scale, nonlinear, and time-varying plants. It is based on a novel identification method of small variations of parameters, which is named the SANQ (simulator-based approach to neat and quick system identification) method. The method does not require enriching input signals for the purpose of identification; with this system, one can estimate both the location and the injury of the failure neatly and quickly. In order to deal with large-scale plants, the plants are divided into small blocks. This reduces the number of parameters to be estimated at one time. The SANQ method provides estimates of the state variables of plants as well. Consequently, an model reference adaptive control system combined with the SANQ method will be a very useful scheme in recovering a faulted plant. The overall system consisting of the functions of diagnosis of a failure, estimation of dynamic property after failure, and appropriate control which leads to the ideal state will raise the reliability of the plant operation.

Original languageEnglish
Title of host publicationIECON Proceedings (Industrial Electronics Conference)
PublisherPubl by IEEE
Pages149-154
Number of pages6
ISBN (Print)0879426888
Publication statusPublished - Dec 1 1991
EventProceedings of the 1991 International Conference on Industrial Electronics, Control and Instrumentation - IECON '91 - Kobe, Jpn
Duration: Oct 28 1991Nov 1 1991

Publication series

NameIECON Proceedings (Industrial Electronics Conference)
Volume1

Other

OtherProceedings of the 1991 International Conference on Industrial Electronics, Control and Instrumentation - IECON '91
CityKobe, Jpn
Period10/28/9111/1/91

Fingerprint

Model reference adaptive control
Adaptive control systems
Identification (control systems)
Simulators

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Uchida, M., Toyota, Y., Nakamura, H., Sagara, S., Kumamara, K., Wada, K., & Murata, J. (1991). Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters. In IECON Proceedings (Industrial Electronics Conference) (pp. 149-154). (IECON Proceedings (Industrial Electronics Conference); Vol. 1). Publ by IEEE.

Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters. / Uchida, M.; Toyota, Y.; Nakamura, H.; Sagara, S.; Kumamara, K.; Wada, K.; Murata, Junichi.

IECON Proceedings (Industrial Electronics Conference). Publ by IEEE, 1991. p. 149-154 (IECON Proceedings (Industrial Electronics Conference); Vol. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Uchida, M, Toyota, Y, Nakamura, H, Sagara, S, Kumamara, K, Wada, K & Murata, J 1991, Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters. in IECON Proceedings (Industrial Electronics Conference). IECON Proceedings (Industrial Electronics Conference), vol. 1, Publ by IEEE, pp. 149-154, Proceedings of the 1991 International Conference on Industrial Electronics, Control and Instrumentation - IECON '91, Kobe, Jpn, 10/28/91.
Uchida M, Toyota Y, Nakamura H, Sagara S, Kumamara K, Wada K et al. Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters. In IECON Proceedings (Industrial Electronics Conference). Publ by IEEE. 1991. p. 149-154. (IECON Proceedings (Industrial Electronics Conference)).
Uchida, M. ; Toyota, Y. ; Nakamura, H. ; Sagara, S. ; Kumamara, K. ; Wada, K. ; Murata, Junichi. / Failure diagnosis for a large-scale, nonlinear and time-varying plant based on a new identification method of small variations of parameters. IECON Proceedings (Industrial Electronics Conference). Publ by IEEE, 1991. pp. 149-154 (IECON Proceedings (Industrial Electronics Conference)).
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