Abstract
Herein, we report a feasibility study for elimination of the screening current-induced field (SCIF) in fully insulated (INS) and no-insulation (NI) GdBCO coated conductor (CC) coils exposed to an external AC magnetic field generated by background solenoid copper coils. Prior to investigating the effects of external AC magnetic fields on SCIF in the GdBCO CC coils, the magnetic flux density (Bz) was calculated using the equivalent circuit model and compared to the Bz obtained empirically to quantify the SCIF in the INS and NI coils. The value of the SCIF in the NI coil was smaller than that in the INS coil without the use of an external AC magnetic field, due to the current paths originating from the turn-to-turn and layer-to-layer contacts, suggesting that the screening current dissipated by contact resistance during charging. When the INS and NI coils were exposed to the external AC magnetic field, the Bz of the coils increased gradually, and eventually saturating to the calculated Bz values, indicating full removal of the SCIF. In addition, the SCIF of the NI coil could be removed under subjection to a lower external AC magnetic field compared to the INS coil, due to the lower SCIF occurring in the NI coil after charging.
| Original language | English |
|---|---|
| Pages (from-to) | 83-88 |
| Number of pages | 6 |
| Journal | Journal of Superconductivity and Novel Magnetism |
| Volume | 28 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Jan 1 2014 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
Cite this
Feasibility Study for Elimination of the Screening Current-Induced Fields in HTS Coil. / Kim, K. L.; Hahn, S.; Choi, Y. H.; Kim, Y. G.; Kang, D. H.; Kajikawa, Kazuhiro; Lee, H. G.
In: Journal of Superconductivity and Novel Magnetism, Vol. 28, No. 1, 01.01.2014, p. 83-88.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Feasibility Study for Elimination of the Screening Current-Induced Fields in HTS Coil
AU - Kim, K. L.
AU - Hahn, S.
AU - Choi, Y. H.
AU - Kim, Y. G.
AU - Kang, D. H.
AU - Kajikawa, Kazuhiro
AU - Lee, H. G.
PY - 2014/1/1
Y1 - 2014/1/1
N2 - Herein, we report a feasibility study for elimination of the screening current-induced field (SCIF) in fully insulated (INS) and no-insulation (NI) GdBCO coated conductor (CC) coils exposed to an external AC magnetic field generated by background solenoid copper coils. Prior to investigating the effects of external AC magnetic fields on SCIF in the GdBCO CC coils, the magnetic flux density (Bz) was calculated using the equivalent circuit model and compared to the Bz obtained empirically to quantify the SCIF in the INS and NI coils. The value of the SCIF in the NI coil was smaller than that in the INS coil without the use of an external AC magnetic field, due to the current paths originating from the turn-to-turn and layer-to-layer contacts, suggesting that the screening current dissipated by contact resistance during charging. When the INS and NI coils were exposed to the external AC magnetic field, the Bz of the coils increased gradually, and eventually saturating to the calculated Bz values, indicating full removal of the SCIF. In addition, the SCIF of the NI coil could be removed under subjection to a lower external AC magnetic field compared to the INS coil, due to the lower SCIF occurring in the NI coil after charging.
AB - Herein, we report a feasibility study for elimination of the screening current-induced field (SCIF) in fully insulated (INS) and no-insulation (NI) GdBCO coated conductor (CC) coils exposed to an external AC magnetic field generated by background solenoid copper coils. Prior to investigating the effects of external AC magnetic fields on SCIF in the GdBCO CC coils, the magnetic flux density (Bz) was calculated using the equivalent circuit model and compared to the Bz obtained empirically to quantify the SCIF in the INS and NI coils. The value of the SCIF in the NI coil was smaller than that in the INS coil without the use of an external AC magnetic field, due to the current paths originating from the turn-to-turn and layer-to-layer contacts, suggesting that the screening current dissipated by contact resistance during charging. When the INS and NI coils were exposed to the external AC magnetic field, the Bz of the coils increased gradually, and eventually saturating to the calculated Bz values, indicating full removal of the SCIF. In addition, the SCIF of the NI coil could be removed under subjection to a lower external AC magnetic field compared to the INS coil, due to the lower SCIF occurring in the NI coil after charging.
UR - http://www.scopus.com/inward/record.url?scp=84925541962&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84925541962&partnerID=8YFLogxK
U2 - 10.1007/s10948-014-2790-y
DO - 10.1007/s10948-014-2790-y
M3 - Article
AN - SCOPUS:84925541962
VL - 28
SP - 83
EP - 88
JO - Journal of Superconductivity and Novel Magnetism
JF - Journal of Superconductivity and Novel Magnetism
SN - 1557-1939
IS - 1
ER -