Femtosecond transient reflecting grating methods and analysis of the ultrafast carrier dynamics on Si(111) surfaces

Tomohiro Morishita, Akihide Hibara, Tsuguo Sawada, Isao Tsuyumoto, Akira Harata

    Research output: Contribution to journalArticle

    9 Citations (Scopus)

    Abstract

    The femtosecond transient reflecting grating (TRG) method was developed and applied to monitor the ultrafast dynamics of photo-excited carriers on Si(111) surfaces. TRG responses were measured as a function of the pump beam intensity and fringe spacing, and two relaxation components were observed. An analysis of the results has suggested that the slow component corresponds to carrier diffusion and that the fast component corresponds to a combined process between ballistic transport and carrier-carrier scattering of non- equilibrium carriers.

    Original languageEnglish
    Pages (from-to)403-406
    Number of pages4
    Journalanalytical sciences
    Volume16
    Issue number4
    DOIs
    Publication statusPublished - Apr 2000

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    Ballistics
    Pumps
    Scattering

    All Science Journal Classification (ASJC) codes

    • Analytical Chemistry

    Cite this

    Femtosecond transient reflecting grating methods and analysis of the ultrafast carrier dynamics on Si(111) surfaces. / Morishita, Tomohiro; Hibara, Akihide; Sawada, Tsuguo; Tsuyumoto, Isao; Harata, Akira.

    In: analytical sciences, Vol. 16, No. 4, 04.2000, p. 403-406.

    Research output: Contribution to journalArticle

    Morishita, Tomohiro ; Hibara, Akihide ; Sawada, Tsuguo ; Tsuyumoto, Isao ; Harata, Akira. / Femtosecond transient reflecting grating methods and analysis of the ultrafast carrier dynamics on Si(111) surfaces. In: analytical sciences. 2000 ; Vol. 16, No. 4. pp. 403-406.
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    AU - Tsuyumoto, Isao

    AU - Harata, Akira

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