Field emission characterristics of defect-controlled polyimide tunneling cathode

Akiyoshi Baba, Tomoya Yoshida, Tanemasa Asano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationTechnical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003
EditorsMikio Takai, Junzo Ishikawa, Yasuhito Gotoh
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages267-268
Number of pages2
ISBN (Electronic)4818195154, 9784818195158
DOIs
Publication statusPublished - Jan 1 2003
Event16th International Vacuum Microelectronics Conference, IVMC 2003 - Toyonaka, Osaka, Japan
Duration: Jul 7 2003Jul 11 2003

Publication series

NameProceedings of the IEEE International Vacuum Microelectronics Conference, IVMC
Volume2003-January

Other

Other16th International Vacuum Microelectronics Conference, IVMC 2003
CountryJapan
CityToyonaka, Osaka
Period7/7/037/11/03

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Baba, A., Yoshida, T., & Asano, T. (2003). Field emission characterristics of defect-controlled polyimide tunneling cathode. In M. Takai, J. Ishikawa, & Y. Gotoh (Eds.), Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003 (pp. 267-268). [1223086] (Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC; Vol. 2003-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVMC.2003.1223086