Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction

Fumio Takechi, Einoshin Suzuki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProc. Nineteenth International Conference on Machine Learning (ICML 2002)
Pages618-625
Number of pages8
Publication statusPublished - 2002

Cite this

Takechi, F., & Suzuki, E. (2002). Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction. In Proc. Nineteenth International Conference on Machine Learning (ICML 2002) (pp. 618-625)

Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction. / Takechi, Fumio; Suzuki, Einoshin.

Proc. Nineteenth International Conference on Machine Learning (ICML 2002). 2002. p. 618-625.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Takechi, F & Suzuki, E 2002, Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction. in Proc. Nineteenth International Conference on Machine Learning (ICML 2002). pp. 618-625.
Takechi F, Suzuki E. Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction. In Proc. Nineteenth International Conference on Machine Learning (ICML 2002). 2002. p. 618-625
Takechi, Fumio ; Suzuki, Einoshin. / Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction. Proc. Nineteenth International Conference on Machine Learning (ICML 2002). 2002. pp. 618-625
@inproceedings{73e0af8da9b947efbc10cd16dc300ad7,
title = "Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction",
author = "Fumio Takechi and Einoshin Suzuki",
year = "2002",
language = "English",
pages = "618--625",
booktitle = "Proc. Nineteenth International Conference on Machine Learning (ICML 2002)",

}

TY - GEN

T1 - Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction

AU - Takechi, Fumio

AU - Suzuki, Einoshin

PY - 2002

Y1 - 2002

M3 - Conference contribution

SP - 618

EP - 625

BT - Proc. Nineteenth International Conference on Machine Learning (ICML 2002)

ER -