Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering

Yifang Zhao, Suguru Koike, Rikuto Nakama, Shiro Ihara, Masatoshi Mitsuhara, Mitsuhiro Murayama, Satoshi Hata, Hikaru Saito

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2 Citations (Scopus)

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